简介概要

Microstructure of SiC Whiskers with Different Cross-sections Perpendicular to the Whiskers Axis

来源期刊:JOURNAL OF MATERIALS SCIENCE TECHNOLOG1992年第1期

论文作者:宁小光 吕毓雄 胡魁毅 叶恒强

文章页码:1 - 8

摘    要:<正> Microstructure of β-SiC whiskers with differ-ent cross-sections perpendicular to their growingdirection was studied in detail by transmission elec-tron microscopy (TEM).It was indicated that therewere three types of cross-sections:round,hexagonal and trigonal.The whiskers with roundand hexagonal cross-sections had a high density ofplanar faults lying on the (111) close packed planesperpendicular to the whisker axis.There existed afew stacking faults on the other {111} planes insome hexagonal whiskers.The whiskers withbicrystals were also found in hexagonal whiskers.The microstructure of trigonal SiC whiskers wasbasically perfect but there were a few intrinsic stack-ing faults on the (11) planes (mostly) and (111)planes.The characters of electron diffraction pat-terns of β-SiC whiskers with different cross-sec-tions were reasonably analyzed using a reciprocalspace model with continuous diffraction streaksalong the [111] reciprocal direction.

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Microstructure of SiC Whiskers with Different Cross-sections Perpendicular to the Whiskers Axis

宁小光,吕毓雄,胡魁毅,叶恒强

摘 要:<正> Microstructure of β-SiC whiskers with differ-ent cross-sections perpendicular to their growingdirection was studied in detail by transmission elec-tron microscopy (TEM).It was indicated that therewere three types of cross-sections:round,hexagonal and trigonal.The whiskers with roundand hexagonal cross-sections had a high density ofplanar faults lying on the (111) close packed planesperpendicular to the whisker axis.There existed afew stacking faults on the other {111} planes insome hexagonal whiskers.The whiskers withbicrystals were also found in hexagonal whiskers.The microstructure of trigonal SiC whiskers wasbasically perfect but there were a few intrinsic stack-ing faults on the (11) planes (mostly) and (111)planes.The characters of electron diffraction pat-terns of β-SiC whiskers with different cross-sec-tions were reasonably analyzed using a reciprocalspace model with continuous diffraction streaksalong the [111] reciprocal direction.

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