简介概要

Optical and structural properties of highly porous shell structured Fe doped TiO2 thin films

来源期刊:Rare Metals2014年第5期

论文作者:C.S.Naveen P.Raghu H.M.Mahesh K.Narasimha Rao R.Rakesh Kumar

文章页码:578 - 582

摘    要:TiO2thin films with 0.2 wt%, 0.4 wt%, 0.6wt%, and 0.8 wt% Fe were prepared on glass and silicon substrates using sol–gel spin coating technique. The optical cut-off points are increasingly red-shifted and the absorption edge is shifted over the higher wavelength region with Fe content increasing. As Fe content increases, the optical band gap decreases from 3.03 to 2.48 eV whereas the tail width increases from 0.26 to 1.43 eV. The X-ray diffraction(XRD) patterns for doped films at 0.2 wt% and0.8 wt% Fe reveal no characteristic peaks, indicating that the film is amorphous whereas undoped TiO2exhibits(101) orientation with anatase phase. Thin films of higher Fe content exhibit a homogeneous, uniform, and nanostructured highly porous shell morphology.

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Optical and structural properties of highly porous shell structured Fe doped TiO2 thin films

C.S.Naveen1,P.Raghu1,H.M.Mahesh1,K.Narasimha Rao2,R.Rakesh Kumar2

1. Department of Electronic Science, Bangalore UniversityJnanabharathi2. Department of Instrumentation and Applied Physics,Indian Institute of Science

摘 要:TiO2thin films with 0.2 wt%, 0.4 wt%, 0.6wt%, and 0.8 wt% Fe were prepared on glass and silicon substrates using sol–gel spin coating technique. The optical cut-off points are increasingly red-shifted and the absorption edge is shifted over the higher wavelength region with Fe content increasing. As Fe content increases, the optical band gap decreases from 3.03 to 2.48 eV whereas the tail width increases from 0.26 to 1.43 eV. The X-ray diffraction(XRD) patterns for doped films at 0.2 wt% and0.8 wt% Fe reveal no characteristic peaks, indicating that the film is amorphous whereas undoped TiO2exhibits(101) orientation with anatase phase. Thin films of higher Fe content exhibit a homogeneous, uniform, and nanostructured highly porous shell morphology.

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