X-RAY POWDER DIFFRACTION DATA AND STRUCTURE REFINEMENT OF COMPOUND ErNi₂Si₂

来源期刊：中国有色金属学报(英文版)1998年第4期

论文作者：Yan Jialin Ou Xiangli Zeng Lingmin Hao Jianmin

文章页码：622 - 625

Key words：ErNi₂Si₂　,X-ray powder diffraction　,Rietveld structure refinement

Abstract: The X-ray powder diffraction data for ErNi₂Si₂are given and the crystal structure has been refined by the Rietveld whole-pattern-fitting method. The compound ErNi₂Si₂crystallizes with the ThCr₂Si₂ type structure (tetragonal, space group I4/mmm,Z=2). The refined lattice parameters area=3.9321(1),c=9.5237(1) and the structure was refined toR_p=13.09%,R_wp=16.69%. The figure of meritFN for the powder data isF₃₀=108.2 ( 0.0063,44 ).