分离基体ICP-AES法测定高纯钽及其氧化物中杂质元素
来源期刊：中南大学学报(自然科学版)2000年第3期
论文作者：李淑兰 任凤莲 陈莉 胡黔南 宋鸽
文章页码：242 - 245
关键词：钽; ICP-AES法;基体效应;光谱干扰;离子交换树脂;分离
Key words：tantalum; ICP-AES method; matrix effect; spectral interference; ion-exchange resin; separation
摘 要：为了解决高纯钽及其氧化物中杂质元素的测定问题,采用ICP-AES测定方法,对测定中基体效应及光谱干扰进行了研究,讨论了分离速率、洗脱液量及其浓度等因素对基体分离效果和杂质元素回收率的影响,建立了简便、快速、准确测定高纯钽及其氧化物中杂质元素的新方法.研究结果表明:用该法测定高纯Ta2O5中12种杂质元素回收率在90%~110%之间,相对标准偏差小于8·15%.其准确度及精密度均较好,可以适用于日常配合分析以及出口产品的控制分析.
Abstract: In order to determine high-purity tantalum and its oxide, this paper adopted the determination way of ICPAES. The matrix effect and spectral interference oftantalum in ICP-AESwere studied. The speed of separation, the concentration and volume of eluentwere investigated. Anewsimple, rapid and accurate methodwas developed forthe determination of impurity in high-purity tantalum and its oxide. The recovery of 12 elements is between 90%~110%, and the relative standard deviation is lower than 8.15%. The accuracy and precision of the method are satisfactory.
