简介概要

Fabricating Buffer Layers for YBa2Cu3Oy Coated Conductor by Surface Oxidation Epitaxy

来源期刊:JOURNAL OF RARE EARTHS2005年第4期

论文作者:QU fei Fan Hongyan LIU Huizhou Yang Jian Gu Hongwei

Key words:metal material; cube texture; surface-oxidation epitaxy; NiO buffer layer; rare earths;

Abstract: NiO buffer layers were formed on a tape of Ni for making YBCO coated conductor by surface-oxidation epitaxy (SOE) process. Different oxidizing conditions such as temperature and duration were studied for Ni tapes. It is found that the texture of NiO could be affected directly by the orientation and surface of substrate. X-ray diffraction (XRD) 2-2θ scan, φ-scan, and pole figure were employed to characterize the in-plane alignment and cube texture. X-ray φ-scan shows that NiO film is formed on Ni tape with high cube texture and a typical value at the full width at half maximum (FWHM) is ≤7.5°. Scanning electron microscopy was used to study the surface morphology of NiO films. No crack is found and the films appear dense. Such technique is simple and of low cost with perfect reproducibility, promising for developing long tapes.

详情信息展示

Fabricating Buffer Layers for YBa2Cu3Oy Coated Conductor by Surface Oxidation Epitaxy

QU fei1,Fan Hongyan2,LIU Huizhou1,Yang Jian1,Gu Hongwei1

(1.Superconducting Materials Research Center, General Research Institute for Non-Ferrous Metals, Beijing 100088, China;
2.Research and Development Department, General Research Institute for Non-Ferrous Metals, Beijing 100088, China)

Abstract:NiO buffer layers were formed on a tape of Ni for making YBCO coated conductor by surface-oxidation epitaxy (SOE) process. Different oxidizing conditions such as temperature and duration were studied for Ni tapes. It is found that the texture of NiO could be affected directly by the orientation and surface of substrate. X-ray diffraction (XRD) 2-2θ scan, φ-scan, and pole figure were employed to characterize the in-plane alignment and cube texture. X-ray φ-scan shows that NiO film is formed on Ni tape with high cube texture and a typical value at the full width at half maximum (FWHM) is ≤7.5°. Scanning electron microscopy was used to study the surface morphology of NiO films. No crack is found and the films appear dense. Such technique is simple and of low cost with perfect reproducibility, promising for developing long tapes.

Key words:metal material; cube texture; surface-oxidation epitaxy; NiO buffer layer; rare earths;

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