X射线荧光光谱法测定生铁中10种元素
来源期刊：冶金分析2011年第4期
论文作者：高建民 曲志勇 张愈洁 应晓浒
文章页码：39 - 43
关键词：X射线荧光光谱； 生铁； 白口化
Key words：X-ray fluorescence spectrometry； cast iron； whiting
摘 要：采用波长色散X射线荧光光谱仪测定生铁中碳、硅、锰、磷、硫、钛、钒、铬、镍、铜等10个元素的含量。选择晶格面间距宽的晶体,其X射线荧光信号明显增强。试验了试样白口化对测量结果的影响,发现试样表面白口化与否和白口化的程度明显影响碳、硅、磷、硫等元素的测量结果,但对锰的影响很小。方法的检出限为1.2114μg/g。精密度试验结果表明,难于同时分析的碳、硅、锰、磷、硫的相对标准偏差(RSD,n=11)分别为0.57%、1.3%、0.53%、0.98%、1.2%。方法用于生铁样品中10种元素的分析,测量结果与其他方法的分析结果相符。
Abstract: Ten elements including C,Si,Mn,P,S,Ti,V,Cr,Ni,Cu in cast iron were determined by wavelength dispersive X-ray fluorescence spectrometer.Crystal OVO-C was selected for measuring C,and the obtained intensity was higher than that measured by crystal OVO-55.The influence of the whiting level of sample on the determination results was tested.The whiting and whiting level of sample surface influences the results of C,Si,P and S obviously,but has little effect on the results of Mn.The detection limit was 1.2-114 μg/g.The precision test indicated that the relative standard deviation (RSD,n=11) of C,Si,Mn,P and S,which were hardly simultaneously analyzed,were 0.57%,1.3%,0.53%,0.98% and 1.2%.The method has been applied for the determination of 10 elements in cast iron samples,the results were consistent with those obtained by other methods.
高建民1，曲志勇1，张愈洁1，应晓浒2
(1.山东省烟台市烟台出入境检验检疫局
2.布鲁克AXS北京代表处，北京 100081)
摘 要：采用波长色散X射线荧光光谱仪测定生铁中碳、硅、锰、磷、硫、钛、钒、铬、镍、铜等10个元素的含量。选择晶格面间距宽的晶体,其X射线荧光信号明显增强。试验了试样白口化对测量结果的影响,发现试样表面白口化与否和白口化的程度明显影响碳、硅、磷、硫等元素的测量结果,但对锰的影响很小。方法的检出限为1.2114μg/g。精密度试验结果表明,难于同时分析的碳、硅、锰、磷、硫的相对标准偏差(RSD,n=11)分别为0.57%、1.3%、0.53%、0.98%、1.2%。方法用于生铁样品中10种元素的分析,测量结果与其他方法的分析结果相符。
关键词：X射线荧光光谱； 生铁； 白口化
