简介概要

INFLUENCE OF THE NONMAGNETIC METAL SPACER ON THE MAGNETIC PROPERTIES AND MICROSTRUCTURE OF THE MULTILAYER FILMS

来源期刊:Acta Metallurgica Sinica2006年第4期

论文作者:H.W. Jiang F.W. Zhu W.Y. Lai G.H. Yu M.H. Li

Key words:NiFe/FeMn; nonmagnetic spacer; exchange coupling; XPS (X-ray photo-electron spectroscopy);

Abstract: Ta/NiFe/Bi (Ag,Cu)/FeMn/Ta and Ta/NiFeⅠ/FeMn/Bi (Ag, Cu)/NiFeⅡ/Ta films were prepared by magnetic sputtering. The texture and the dependences of the exchange-coupling field on the thickness of Bi, Ag, and Cu in Ta/NiFe/Bi(Ag, Cu) /FeMn/Ta and Ta/NiFeⅠ/FeMn/Bi(Ag, Cu)/NiFeⅡ/Ta films were studied. XPS results indicate that the Bi atoms migrated into the FeMn layer during the deposition process and a FeMnBi alloy was probably formed or the Bi atoms existed as an impurity in the FeMn layer in Ta/NiFe/Bi(Ag, Cu)/FeMn/Ta. Otherwise, in Ta/NiFeⅠ/FeMn/Bi (Ag, Cu ) /NiFeⅡ/Ta films, Bi, Ag, and Cu atoms do not remain entirely at the interface of the FeMn/NiFeⅡ film, but at least partly segregate to the surface of the NiFe film.

详情信息展示

INFLUENCE OF THE NONMAGNETIC METAL SPACER ON THE MAGNETIC PROPERTIES AND MICROSTRUCTURE OF THE MULTILAYER FILMS

H.W. Jiang1,F.W. Zhu2,W.Y. Lai3,G.H. Yu2,M.H. Li4

(1.Department of Physics, Capital Normal University, Beijing 100037, China;
2.Department of Materials Physics, University of Science and Technology Beijing, Beijing 100083,China;
3.Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China;
4.College of Mechanical Engineering, South China University of Technology, Guangzhou 510640,China)

Abstract:Ta/NiFe/Bi (Ag,Cu)/FeMn/Ta and Ta/NiFeⅠ/FeMn/Bi (Ag, Cu)/NiFeⅡ/Ta films were prepared by magnetic sputtering. The texture and the dependences of the exchange-coupling field on the thickness of Bi, Ag, and Cu in Ta/NiFe/Bi(Ag, Cu) /FeMn/Ta and Ta/NiFeⅠ/FeMn/Bi(Ag, Cu)/NiFeⅡ/Ta films were studied. XPS results indicate that the Bi atoms migrated into the FeMn layer during the deposition process and a FeMnBi alloy was probably formed or the Bi atoms existed as an impurity in the FeMn layer in Ta/NiFe/Bi(Ag, Cu)/FeMn/Ta. Otherwise, in Ta/NiFeⅠ/FeMn/Bi (Ag, Cu ) /NiFeⅡ/Ta films, Bi, Ag, and Cu atoms do not remain entirely at the interface of the FeMn/NiFeⅡ film, but at least partly segregate to the surface of the NiFe film.

Key words:NiFe/FeMn; nonmagnetic spacer; exchange coupling; XPS (X-ray photo-electron spectroscopy);

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