Effect of annealing process on structures and ferroelectric properties of Ca0.4Sr0.6Bi3.95Nd0.05Ti4O15 thin films
来源期刊：Journal of Rare Earths2009年第2期
论文作者：范素华 张伟 王培吉 张丰庆 冯博楷
文章页码：216 - 221
摘 要：Ca0.4Sr0.6Bi3.95Nd0.05Ti4O15 （C0.4S0.6BNT） ferroelectric thin films were prepared on Pt/Ti/SiO2/Si substrates by sol-gel method. Effect of annealing process （time and temperature） on structures and ferroelectric properties of C0.4S0.6BNT thin film was investigated. The relative intensity of （200） peak increased first then decreased with annealing temperature and became predominant at 800 °C. In contrast, no evident change could be observed in the （00l） peak. The remnant polarization （Pr） and coercive field （Ec） for C0.4S0.6BNT film annealed at 800 °C for 5 min were 21.6 μC/cm2 and 68.3 kV/cm, respectively.
范素华1，张伟1，王培吉2，张丰庆1，冯博楷1
1. Department of Materials Science and Engineering,Shandong Jianzhu University,Jinan 250101,China2. Department of Science,Jinan University,Jinan 250022,China
摘 要：Ca0.4Sr0.6Bi3.95Nd0.05Ti4O15 （C0.4S0.6BNT） ferroelectric thin films were prepared on Pt/Ti/SiO2/Si substrates by sol-gel method. Effect of annealing process （time and temperature） on structures and ferroelectric properties of C0.4S0.6BNT thin film was investigated. The relative intensity of （200） peak increased first then decreased with annealing temperature and became predominant at 800 °C. In contrast, no evident change could be observed in the （00l） peak. The remnant polarization （Pr） and coercive field （Ec） for C0.4S0.6BNT film annealed at 800 °C for 5 min were 21.6 μC/cm2 and 68.3 kV/cm, respectively.
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