简介概要

MEVVA磁过滤等离子技术制备的Fe纳米颗粒薄膜结构

图书来源:二元合金相图及中间相晶体结构 二元合金相图及中间相晶体结构

作 者:唐仁政 田荣璋

出版时间:2009-05

定 价:320元

图书ISBN:978-7-81105-831-4

出版单位:中南大学出版社

详情信息展示

An Inverse Approach for Extracting Elastic-plastic Properties of Thin Films from Small Scale Sharp Indentation

Z.S.Ma 1,2),Y.C.Zhou 1,2),S.G.Long 1,2) and C.S.Lu 3) 1) Key Laboratory of Low Dimensional Materials & Application Technology of Ministry of Education,Xiangtan University,Xiangtan 411105,China 2) Faculty of Materials,Optoelectronics and Physics,Xiangtan University,Xiangtan 411105,China 3) Department of Mechanical Engineering,Curtin University of Technology,Perth,WA 6845,Australia

摘 要:An inverse method for extracting the elastic-plastic properties of metallic thin films from instrumented sharp indentation has been proposed in terms of dimensional analysis and finite element modeling.A wide range of materials with different elastic modulus,yield strength,and strain-hardening exponent were examined.Similar to the Nix-Gao model for the depth dependence of hardness H,(H/H0)2=1+h*Hh,the relationship between elastic modulus E and indentation depth h can be expressed as(E/E0)4=1+h*Eh.By combining these two formulas,we find that there is a relationship between yield stress σ y and indentation depth h:σy = σy0·(1+h*Hh)f(n)·(1+h*Eh)[0.25-0.54f(n)],where σ y0 is the yield strength associated with the strainhardening exponent n,the true hardness H0 and the true elastic modulus E0.f(n)= 1/2(1-n) is constant,which is only related to n,and h*H and h*E are characteristic lengths for hardness and elastic modulus.The results obtained from inverse analysis show that the elastic-plastic properties of thin films can be uniquely extracted from the solution of this relationship when the indentation size effect has to be taken into account.

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