Sequential fault diagnosis strategy with imperfect tests considering life cycle cost

ZHANG Shi-gang(张士刚), HU Zheng(胡政), WEN Xi-sen(温熙森)

(Laboratory of Science and Technology on Integrated Logistics Support, College of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha 410073, China)

Abstract:The problem of sequential fault diagnosis is to construct a diagnosis tree that can isolate the failure sources with minimal test cost. Pervious sequential fault diagnosis strategy generating algorithms only consider the execution cost at application stage, which may result in a solution with poor quality from the view of life cycle cost. Furthermore, due to the fact that uncertain information exists extensively in the real-world systems, the tests are always imperfect. In order to reduce the cost of fault diagnosis in the realistic systems, the sequential fault diagnosis problem with imperfect tests considering life cycle cost is presented and formulated in this work, which is an intractable NP-hard AND/OR decision tree construction problem. An algorithm based on AND/OR graph search is proposed to solve this problem. Heuristic search based on information theory is applied to generate the sub-tree in the algorithm. Some practical issues such as the method to improve the computational efficiency and the diagnosis strategy with multi-outcome tests are discussed. The algorithm is tested and compared with previous algorithms on the simulated systems with different scales and uncertainty. Application on a wheel momentum system of a spacecraft is studied in detail. Both the simulation and application results suggest that the cost of the diagnosis strategy can be reduced significantly by using the proposed algorithm, especially when the placement cost of the tests constitutes a large part of the total cost.

Key words:test sequencing problem; sequential fault diagnosis; imperfect test; life cycle cost; AND/OR graph