C-S-H Cluster Microstructure and Bonding Force Investigation base on AFM Technology
来源期刊：Journal Of Wuhan University Of Technology Materials Science Edition2010年第4期
论文作者：张博 何真
文章页码：592 - 595
摘 要：AFM （atomic force microscopy） technology was applied on C-S-H （calcium silicate hydrate phase） microstructure investigation. The topographies of hydrated C3S （Tricalcium silicate） samples were firstly acquired with AFM. Accordingly, C-S-H can be identified according its pattern. Then the hydrated pssortland cement samples at different curing time were scanned with AFM. The topographies and force displacement curve were acquired and its characters at different days were summarized and analyzed. These results are very meaningful for C-S-H microstructure further investigation and cement-base material macro scale properties improvement.
张博，何真
State Key Laboratory of Water Resources and Hydropower Engineering Science, Wuhan University
摘 要：AFM （atomic force microscopy） technology was applied on C-S-H （calcium silicate hydrate phase） microstructure investigation. The topographies of hydrated C3S （Tricalcium silicate） samples were firstly acquired with AFM. Accordingly, C-S-H can be identified according its pattern. Then the hydrated pssortland cement samples at different curing time were scanned with AFM. The topographies and force displacement curve were acquired and its characters at different days were summarized and analyzed. These results are very meaningful for C-S-H microstructure further investigation and cement-base material macro scale properties improvement.
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