Effects of Lanthanum, Cerium and Ytterbium on Ni-P Deposition on Quartz Optical Fiber Surface by Electroless Plating
来源期刊：Journal of Rare Earths2007年第S1期
论文作者：蒋柏泉 刘贤相 白立晓 张书扬 张华 王敏炜
文章页码：27 - 32
摘 要：The main purpose of this article is to use rare earths to modify the electroless plating process for metallizing the surface of quartz optical fibers （silicon fibers）. The effects of Yb, Ce and La on the deposition rate of Ni-P, the stability of plating solution and the surface structure of Ni-P film were investigated and their mechanisms were discussed. The surface morphonogies and compositions of the Ni-P films were characterized and analyzed by SEM, MSM, XRD and ESM, respectively. The experimental results showed that Ce（SO4）2 with concentration of 40 mg·L-1 was proved to be the best choice for increasing the deposition rate, enhancing the stability of plating solution and improving the quality of deposited Ni-P film compared with the other two kind of rare earths. The detections of ESM exhibited no effect of Ce on film compositions and no Ce deposition being found in the film prepared by electroless plating with adding Ce because of its much more negative deposition potential than those of the reducing agents used in the experiment. The addition of Ce resulted in a transmission of the film surface structure from crystal structure into a microcrystallitic structure. The Ni-P film with thickness of about 45 μm prepared using electroless plating by adding Ce（SO4）2 with concentration of 40 mg·L-1 had good quality, which will be satisfactorily for the next Ni deposition by electroplating.
蒋柏泉，刘贤相，白立晓，张书扬，张华，王敏炜
摘 要：The main purpose of this article is to use rare earths to modify the electroless plating process for metallizing the surface of quartz optical fibers （silicon fibers）. The effects of Yb, Ce and La on the deposition rate of Ni-P, the stability of plating solution and the surface structure of Ni-P film were investigated and their mechanisms were discussed. The surface morphonogies and compositions of the Ni-P films were characterized and analyzed by SEM, MSM, XRD and ESM, respectively. The experimental results showed that Ce（SO4）2 with concentration of 40 mg·L-1 was proved to be the best choice for increasing the deposition rate, enhancing the stability of plating solution and improving the quality of deposited Ni-P film compared with the other two kind of rare earths. The detections of ESM exhibited no effect of Ce on film compositions and no Ce deposition being found in the film prepared by electroless plating with adding Ce because of its much more negative deposition potential than those of the reducing agents used in the experiment. The addition of Ce resulted in a transmission of the film surface structure from crystal structure into a microcrystallitic structure. The Ni-P film with thickness of about 45 μm prepared using electroless plating by adding Ce（SO4）2 with concentration of 40 mg·L-1 had good quality, which will be satisfactorily for the next Ni deposition by electroplating.
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