Abstract: A nanostructured surface layer was fabricated on an aluminum alloy 1420 by using a high-energy shot peening (HESP) technique. HESP induced structure alone the depth of the treated sample surface layer was characterized by means of X-ray diffraction,transmission electron microscope and high-resolution electron microscope; and the hardness variation along the depth of the treated sample was examined. Experimental results show that nanostructured surface layer of about 20 μm of thickness is formed after HESP, the average grain size increases from about 20 nm in the surface layer to about 100 nm at a depth of 20 μm. In the region of 20-50μm deep from the surface, there exists submicro-fine grained layer. The degree of the surface crystallization is related to the amount of the plasticity deformation.The surface nanocrystallization can realize by the method of the plastic deformation of dislocation slipping. The hardness of nanostructured surface layer is enhanced significantly after HESP compared with that of the initial sample.
Microstructure and characterization of surface nanocrystallization of aluminum alloy
Abstract:
A nanostructured surface layer was fabricated on an aluminum alloy 1420 by using a high-energy shot peening (HESP) technique. HESP induced structure alone the depth of the treated sample surface layer was characterized by means of X-ray diffraction, transmission electron microscope and high-resolution electron microscope; and the hardness variation along the depth of the treated sample was examined. Experimental results show that nanostructured surface layer of about 20 μm of thickness is formed after HESP, the average grain size increases from (about)20 nm in the surface layer to about 100 nm at a depth of 20 μm. In the region of 2050 μm deep from the surface, there exists submicro-fine grained layer. The degree of the surface crystallization is related to the amount of the plasticity deformation.The surface nanocrystallization can realize by the method of the plastic deformation of dislocation slipping. The hardness of nanostructured surface layer is enhanced significantly after HESP compared with that of the initial sample.
图4 距样品表面20 μm处的TEM明场像 Fig.4 Bright-field TEM image of layer at distance of 20 μm from surface layer of HESP treated specimen
图5 距样品表面5 μm处的TEM明场像和 选区电子衍射花样 Fig.5 Bright-field TEM image and corresponding SAED pattern of layer at distance of 5 μm from surface layer of HESP treated specimen