Microstrain in Nanocrystalline Copper by High Resolution Electron Microscopy
来源期刊：Journal Of Wuhan University Of Technology Materials Science Edition2009年第4期
论文作者：闵长平 邹化民
文章页码：528 - 532
摘 要：The elastic microstrains in a crystallite of electrodeposited nanocrystalline copper were investigated by analyzing the high resolution electron microscopy （HRTEM） image. The microstrain was considered as consisting of two parts, in which the uniform part was determined with fast Fourier transformation of the HRTEM image, while the non-uniform part of the microstrain in the crystallite was measured by means of peak finding. Atomic column spacing measurements show that the crystal lattice is contracted in the longitudinal direction, while expanded in the transverse direction of the elliptical crystallite, indicating that the variation of microstrain exists mainly near the grain boundary.
闵长平1,2，邹化民1,2
1. Key Laboratory of Acoustic & Photonic Material and Device,Ministry of Education,Department of Physics,Wuhan University2. Centre for Electron Microscopy,Wuhan University
摘 要：The elastic microstrains in a crystallite of electrodeposited nanocrystalline copper were investigated by analyzing the high resolution electron microscopy （HRTEM） image. The microstrain was considered as consisting of two parts, in which the uniform part was determined with fast Fourier transformation of the HRTEM image, while the non-uniform part of the microstrain in the crystallite was measured by means of peak finding. Atomic column spacing measurements show that the crystal lattice is contracted in the longitudinal direction, while expanded in the transverse direction of the elliptical crystallite, indicating that the variation of microstrain exists mainly near the grain boundary.
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