简介概要

Oxidized film on Cp/Cu-Cd electrical contact material

来源期刊:中国有色金属学报(英文版)2005年第z2期

论文作者:邵文柱 甄良 李义春 崔玉胜 周劲松

文章页码:251 - 255

Key words:Cu-based composites; electrical contact materials; XPS; oxidation

Abstract: Constituents of the oxidized surface film on diamond particles reinforced Cu-Cd alloy matrix composite (Cp/Cu-Cd) were investigated by XPS. The results show that Cu2O is the main constituent when the oxidized film is thin; CuO appears only after the film is rather thick. The originally formed oxidized film on the Cp/Cu-Cd is about 10nm in thickness and is mainly composed of Cu2O and Cu. After oxidized at 120℃ over 30h, CuO is detected in the film.

详情信息展示

 

<上一页 1 下一页 >

有色金属在线官网  |   会议  |   在线投稿  |   购买纸书  |   科技图书馆

中南大学出版社 技术支持 版权声明   电话:0731-88830515 88830516   传真:0731-88710482   Email:administrator@cnnmol.com

互联网出版许可证:(署)网出证(京)字第342号   京ICP备17050991号-6      京公网安备11010802042557号