Texture evolution of commercial pure Ti during cold rolling and recrystallization annealing

Hai-tao Jiang, Ji-xiong Liu, Zhen-li Mi, Ai-min Zhao, and Yan-jun Bi Metallurgical Engineering Research Institute, University of Science and Technology Beijing, Beijing 100083, China

摘 要：X-ray diffraction （XRD） was employed to analyze the texture evolution of commercial pure （CP） Ti during cold rolling and re-crystallization annealing. The texture components were measured by electron backscattered diffraction （EBSD） after recrystallization an-nealing. The CP Ti tends to form a texture with the basal pole tilted 30°-40° away from the normal direction toward the transverse direction. The texture of the initial hot-rolled plate can be classified into three kinds, i.e., the pyramid texture and , the basal plane texture , and the stronger prism texture . After cold rolling and annealing （700°C, 60 min）, the main texture components are the cold-rolled texture and the recrystallized texture . The texture is in-herited from the texture of the initial hot-rolled plate with the decrease of orientation density gradually. The volume contents of the cold-rolled texture and the recrystallized texture are calculated by EBSD. After recrystallization annealing, the specimen is rich in the recrystallized texture and inherits some of texture components from the cold-rolled texture. When the annealing time is prolonged, the anisotropic value decreases.

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