Crystal structure,microstructure and magnetic properties of SmCo-based films treated by different annealing methods
来源期刊：JOURNAL OF RARE EARTHS2012年第1期
论文作者：彭龙 李元勋
文章页码：34 - 37
摘 要：Effect of conventional thermal annealing（CTA） and rapid recurrent thermal annealing（RRTA） processes on crystal structure,mi-crostructure,and magnetic properties of the SmCo-based films were investigated.The results indicated that the CTA-treated films exhibited poor permanent magnetic properties,and a low intrinsic coercivity of 72.8 kA/m was observed.Wide hysteresis loop was obtained for the RRTA-treated films,providing better permanent magnetic properties.The intrinsic coercivity reached 312.0 kA/m.According to the X-ray diffraction（XRD） and atomic force microscopy（AFM） results,the magnetic properties of the CTA-treated films and RRTA-treated films were found to be correlated with the crystal structure and microstructure,which were strongly determined by the annealing treatment.CTA treatment led to poor crystallization effects for the films,and a rough surface（RMS=3.47 nm and P-V=35.42 nm） and large grain size of 92.7 nm were observed correspondingly.However,the RRTA treatment exhibited great contributions on the crystallization of the films,which is accountable for the smooth surface（RMS=2.047 nm and P-V=16.43 nm） and fine grain size of 60.8 nm.
彭龙，李元勋
College of Optoelectronics Technology,Chengdu University of Information Technology
摘 要：Effect of conventional thermal annealing（CTA） and rapid recurrent thermal annealing（RRTA） processes on crystal structure,mi-crostructure,and magnetic properties of the SmCo-based films were investigated.The results indicated that the CTA-treated films exhibited poor permanent magnetic properties,and a low intrinsic coercivity of 72.8 kA/m was observed.Wide hysteresis loop was obtained for the RRTA-treated films,providing better permanent magnetic properties.The intrinsic coercivity reached 312.0 kA/m.According to the X-ray diffraction（XRD） and atomic force microscopy（AFM） results,the magnetic properties of the CTA-treated films and RRTA-treated films were found to be correlated with the crystal structure and microstructure,which were strongly determined by the annealing treatment.CTA treatment led to poor crystallization effects for the films,and a rough surface（RMS=3.47 nm and P-V=35.42 nm） and large grain size of 92.7 nm were observed correspondingly.However,the RRTA treatment exhibited great contributions on the crystallization of the films,which is accountable for the smooth surface（RMS=2.047 nm and P-V=16.43 nm） and fine grain size of 60.8 nm.
关键词：
