TEM STUDIES FOR DIGM IN Kr ION IRRADIATED Au-Cu BILAYERS

来源期刊：中国有色金属学报(英文版)1996年第3期

论文作者：Gao Yuzun Alexander D E Rehn L E

文章页码：119 - 121

Key words：grain boundary migration;　electron microscopy;　Kr ion

Abstract: Cross-section transmission electron microscopy (TEM) was used to study diffusion induced grain boundary migration (DIGM) in Kr ion irradiated and annealed Au-Cu bilayers. Using this technique, in combination with small probe X-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample.