SURFACE ELECTRICAL PROPERTIES AND STRUCTURE OF YTTRIA-PARTIALLY-STABILIZED ZIRCONIA IMPLANTED WITH 57 Fe IONS
来源期刊：Journal Of Wuhan University Of Technology Materials Science Edition2000年第3期
论文作者：吴建锋
文章页码：52 - 58
摘 要：<正>Sintered plates of 5mol% yttria-partially-stabilized zirconia have been implanted at room temperature with 5×1O15 to 2×1017 Fe+ ions/cm2 at 140 KeV. Electrical measurement, Rutherford backscattering spectroscopy（RBS）, Raman spectroscopy and X-ray photoelectron spectroscopy（XPS） have been used to study the surface electrical properties and the structure of the implanted layer before and after thermal annealing treatment in N2.
吴建锋
摘 要：<正>Sintered plates of 5mol% yttria-partially-stabilized zirconia have been implanted at room temperature with 5×1O15 to 2×1017 Fe+ ions/cm2 at 140 KeV. Electrical measurement, Rutherford backscattering spectroscopy（RBS）, Raman spectroscopy and X-ray photoelectron spectroscopy（XPS） have been used to study the surface electrical properties and the structure of the implanted layer before and after thermal annealing treatment in N2.
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