A systematic method based on statistical pattern recognition for estimating product quality on-line

Guang Li, Huade Li, Shaoyuan Sun, and Zhengguang XuInformation Engineering School, University of Science and Technology Beijing, Beijing 100083, China

摘 要：<正> To avoid the complexity of building mechanistic models by studying the inner nature of the object, a systematic method based on statistical pattern recognition is developed in order to estimate the product quality on-line. The mapping relationship between a feature space and a product quality space can be built by using regression analysis, and in applying clustering analysis the product quality space can be partitioned automatically. Eventually, estimating product quality on-line can be accomplished by sorting the mapped data in the partitioned quality space. A concrete problem is proposed which has a relatively small ratio of training data to input variables. By implementing the method mentioned above, a satisfying result has been achieved. Furthermore, the further question about choosing suitable mapping methods is briefly discussed.

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