简介概要

Electropulsing-Induced Microstructural Changes and Their Effects on Electrical Conductivity of Thin Films of an Al-doped ZnO

来源期刊:Acta Metallurgica Sinica2018年第12期

论文作者:Y.H.Zhu C.M.Luk

文章页码:1361 - 1367

摘    要:Electropulsing-induced phase decompositions and microstructural changes in AZO-5 thin films were studied by X-ray diffraction, scanning electron microscopy, atomic force microscopy, Hall effect measurement and photoluminescence(PL)measurement techniques. It was found that the electropulsing induced phase decomposition started with spinodal decomposition, which was accompanied by discontinuous precipitation in the AZO-5 thin films. Both circular phase decompositions and the crystal orientation occurred. Inappropriate electropulsing might damage zones, which resulted in tremendous decrease in electrical conductivity. Circular changes in both the peak position and the width of the PL wavelength were observed in the EPT AZO-5 thin films. Formation of zones favored reducing the roughness of the thin film.

详情信息展示

Electropulsing-Induced Microstructural Changes and Their Effects on Electrical Conductivity of Thin Films of an Al-doped ZnO

Y.H.Zhu1,C.M.Luk2

1. Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University2. Department of Applied Physics, The Hong Kong Polytechnic University

摘 要:Electropulsing-induced phase decompositions and microstructural changes in AZO-5 thin films were studied by X-ray diffraction, scanning electron microscopy, atomic force microscopy, Hall effect measurement and photoluminescence(PL)measurement techniques. It was found that the electropulsing induced phase decomposition started with spinodal decomposition, which was accompanied by discontinuous precipitation in the AZO-5 thin films. Both circular phase decompositions and the crystal orientation occurred. Inappropriate electropulsing might damage zones, which resulted in tremendous decrease in electrical conductivity. Circular changes in both the peak position and the width of the PL wavelength were observed in the EPT AZO-5 thin films. Formation of zones favored reducing the roughness of the thin film.

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