Amorphous phase stability of NbTiAlSiNx high-entropy films
State Key Laboratory for Advanced Metals and Materials,University of Science and Technology Beijing
Center for Condensed Matter and Materials Physics,Department of Physics,Beihang University
作者简介:*Yong Zhang e-mail:drzhangy@ustb.edu.cn;
收稿日期:23 November 2015
基金:financially supported by the National Natural Science Foundation of China (No.51471025);
Amorphous phase stability of NbTiAlSiNx high-entropy films
Wen-Jie Sheng Xiao Yang Jie Zhu Cong Wang Yong Zhang
State Key Laboratory for Advanced Metals and Materials,University of Science and Technology Beijing
Center for Condensed Matter and Materials Physics,Department of Physics,Beihang University
Abstract:
In this study,high-entropy films with the composition of NbTiAlSiNx were prepared by a reactive direct current(DC) magnetron sputtering technique,with different nitrogen flow rates(0,4 and 8 ml·min-1).The microstructures and properties were characterized by X-ray diffraction(XRD),scanning electron microscopy(SEM),high-resolution transmission electron microscopy(HRTEM),nano-indenter and spectrophotometer.All of the as-deposited NbTiAlSiNX films are shown to have an amorphous structure,and the films exhibit high thermal stability up to 700 ℃.The maximum hardness and modulus values of the films reach 20.5 GPa(4 ml·min-1) and 206.8 GPa(0 ml·min-1),respectively.The films exhibit high absorption of the solar energy in the wavelength of 0.3-2.5 μm,which indicates that NbTiAlSiNX nitride film is a potential candidate solar selective absorbing coating for high-temperature photo-thermal conversion in the concentrated solar power project.
Keyword:
High-entropy film; Sputtering; Amorphous; Photo-thermal conversion; Phase stability;
Received: 23 November 2015
1 Introduction
High-entropy alloys (HEAs)
Expected concentrated solar power (CSP) solar-thermal collector must have high solar energy absorption in the wavelength range of 0.3-2.5μm,and low thermal emissivity in the infrared range (λ≧2.5μm) at high temperatures
In the present paper,NbTiAlSiNX HEA films were prepared using a magnetron sputtering technique in a mixture gas of argon and nitrogen,and the microstructures and properties of these films were studied.
2 Experimental
2.1 Target preparation
Two methods were used for the preparation of sputtering targets,arc-melting and powder metallurgy.(1) Arc-melting:the constituent equi-molar elements of Nb,Ti,Al and Si (with purities of>99.99%) quaternary were melted at least five times to ensure homogeneity,followed by cutting and polishing of the solidified bulk into a disk of 60 mm in diameter and 4 mm in thickness.(2) Powder metallurgy:equi-molar Nb,Ti,Al and Si powders were mixed intensively before being placed in a sheath serving as a mold,then undergoing sintering hot-extrusion,and finally the target is cut and polished into a disk with the predetermined dimensions.When the melting point of constituent elements varies widely,powder metallurgy method is preferred and considered to be more practical than arcmelting.So the sputtering targets were prepared by powder metallurgy method in this paper.
2.2 Films preparation
Films were deposited on different substrates (dimensions26 mm×26 mm×1 mm) using a reactive high-vacuum direct current (DC) sputtering technique.Before placing all of the substrates into the vacuum chamber,the substrates were ultrasonically cleaned and rinsed with acetone,ethanol and deionized water for 15 min.High purity argon was placed into the vacuum chamber when the base pressure was higher than 2.0×10-3 Pa.The target was cleaned by argon ion bombardment for 15 min to remove the oxide or contaminant of the surface,and then the gas flow rate and the paddle valve of the molecular pump were adjusted to the predetermined working pressure.All of the films were deposited in a mixture atmosphere of Ar and N2 at room temperature with a working distance of 60 mm,and the total flow of the argon and nitrogen flow rates was fixed at24 ml·min-1.The relative experimental parameters are listed in Table 1.
2.3 Film characterization
The structure of the film was identified using X-ray diffractometer (XRD,Dmax) with Cu Kα(40 kV,20 mA)radiation and 2θrange of 20°-80°at a scanning speed of 3(°)·min-1 and an incidence angle of 1°.The microstructures of the top view and cross section of the as-deposited films were characterized by scanning electron microscope(SEM,Auriga,Carl Zeiss,Jena,Germany) equipped with energy dispersive X-ray spectrometer (EDS) operated at10 kV.The surface imaging of the as-deposited and heattreated samples was characterized by atomic force microscope (AFM,multimode,VEECO,America).Transmission electron microscope (TEM) observations were carried out with a 300 kV Tecnai F30 at a resolution of 0.205 nm.The films (50-100 nm in thickness) deposited on the singlecrystal NaCl (100) were used for TEM observation.The films fell off as the substrates were dissolved in the deionized water.Then they were ultrasonic ally vibrated into fragments,and the preparation of the specimen for the TEM observations is shown in Fig.1.This is one of the methods for preparing samples for TEM observations,which is easily realized,and could thus be used to reduce the damage of the films to a large degree.The hardness andmodulus of the as-deposited films were tested by a nanoindenter with a Berkovich triangular pyramid indenter.In order to test the thermal stability of the films,the samples were placed in a quartz tube with a vacuum of5×10-3 Pa·heated up to the predetermined temperatures(500,700 and 1000℃) with a heating rate of 15℃·min-1from room temperature,then held there for 24 h,and finally cooled in air.The reflective spectra were measured using a UV3100 spectrophotometer equipped with an integrating sphere coated with barium sulfate in the wavelength range of 0.3-2.5μm and a Fourier transform infrared reflectance (FTIR,Bruker Tensor 27) spectrometer equipped with an integrating sphere coated with gold in the wavelength range of 2.5-25.0μm.The solar absorption (α)and thermal emissivity (ε) were calculated as follows,respectively.
Table 1 Experimental parameters
Fig.1 Schematic image of films for TEM observations
where R(λ) is the measured spectral reflectance at a specific wavelength (λ),Is(λ) is the solar spectra radiation power at AM 1.5,and Ib(λ) is the spectral black body emissive power at room temperature.
3 Results and discussion
3.1 Microstructures
The chemical compositions of the NbTiAlSi metallic film are listed in Table 2.The content of Al in the NbTiAlSi alloy film is much higher,and those of Nb and Ti are lower than nominal content,as the melting point of Al is lower than those of the other three elements.In addition,Al is more reactive than the other elements.The compositions of each element in the film have certain deviation from those of the nominal ones;this is difficult to control,as well as unavoidable,and thus poses a great challenge in the present work.
No evident peak is observed from XRD patterns of asdeposited NbTiAlSiNX film,thus indicating that all of the as-deposited films are amorphous structures,and afterward the structure is confirmed by TEM observations.There are four reasons that could be proposed to account for the formation of an amorphous structure.(1) The sluggish diffusion effect plays a significant role in the formation of the amorphous structure.(2) The mixing enthalpy of the constituent is equal to-41.1 kJ·mol-1,especially the mixing enthalpy between Al and Si,and the other two elements are very negative.(3) Severe lattice distortion,i.e.,the atomic radii of Nb,Ti,Al and Si are 1.429,1.462,1.423 and 1.153 nm,respectively
Table 2 Compositions of NbTiAlSi metallic thin film (at%)
XRD patterns of as-deposited films are shown in Fig.3a.No significant changes are found from XRD patterns of the films before or after heat treatment at 500℃(data are not shown here).Figure 3b shows XRD patterns of NbTiAlSiNX films annealed at 700℃for 24 h in vacuum,but the diffraction peak appears after heat treatment at 700℃and becomes more obvious especially in the metallic film.Moreover,the diffraction peak shifts to a lower angle,and the intensity decreases with the increase in nitrogen flow rate.Both the concentration of nitrogen and the degree of disorder increase significantly in the amorphous structure with the increase in nitrogen,leading to the expansion of the structure and causing the film to be less dense.It can be demonstrated that all of the films still retain an amorphous structure and the amorphous structure is very stable even at a high temperature of 700℃.
Fig.2 Relationship between parametersδandΩ,for high-entropy alloys (parametersδandΩfor NbTiAlSiNX films denoted by a five-pointed star)
SEM cross-sectional images of as-deposited NbTiAlSiNX thin films are shown in Fig.4,and the deposition time is 30 min.The morphology appears very smooth and dense,typical of a dense amorphous film.With the increase in nitrogen flow rate,the deposition rates at different nitrogen flow rates can be obtained according to the thickness and deposition time (nitrogen flow rates of0,4 and 8 ml·min-1,deposition rates of 27.5,17.5 and11.6 nm·min-1,respectively).The deposition rate decreases with the increase in the nitrogen flow rate,which results from the fact that the ionization of Ar reduces,eventually leading to the reduction of the sputtering target atom.The surface topographies of as-deposited NbTiAlSiNX films were characterized by threedimensional AFM,indicating that the surfaces are quite smooth and dense,similar to tiny domed columnar grains(Fig.5).The as-deposited metallic film has a surface roughness value of 11.9 nm,but as nitrogen flow rate increases from 4 to 8 ml·min-1,the surface roughness of the nitride films increases from 9.11 to 20.50 nm.This trend indicates that more nitrogen can induce less dense and smooth amorphous films.
Fig.3 XRD patterns of a as-deposited amorphous and b NbTiAlSiNX thin films after annealing at 700℃for 24 h with different nitrogen flow rates
Fig.4 SEM cross-sectional images of as-deposited NbTiAlSiNX thin films with different nitrogen flow rates:a 0 m·min-1,b 4 ml min-1 and c 8 ml·min-1
Fig.5 Three-dimensional AFM images of as-deposited NbTiAlSiNX thin films with different nitrogen flow rates:a 0 m·min-1,b 4 ml·min-1and c 8 ml·min-1
Figure 6 shows high-resolution transmission electron microscopy (HRTEM) images and selected-area electron diffraction (SAED) patterns of as-deposited films.It is clear that all of the as-deposited NbTiAlSiNX films are amorphous,which is in agreement with the results from XRD patterns.HRTEM images show a typical amorphous structure with a highly disordered yet homogeneous morphology.
3.2 Mechanical properties
The hardness and modulus of as-deposited thin films were tested using a nano-indenter.Each sample was tested with five points,and the maximum displacement into the sample surface is 200 nm.The load-displacement curve,average hardness and modulus are shown in Fig.7.The hardness of the films increases from 18.1 GPa (0 ml·min-1) to a maximum value of 20.5 GPa (4 ml·min-1) and then decreases to 17.4 GPa (8 ml·min-1).For the metallic film,the maximum modulus is 206.8 GPa,but the modulus decreases with the increase in N2 flow rate.It is proposed that the content of nitrogen in the nitride thin film exceeds the corresponding saturation at nitrogen flow rate of8 ml·min-1;thus,the softening process takes place
3.3 Optical properties
NbTiAlSiNX HE A nitride thin films deposited on stainlesssteel substrates exhibit different colors with varied thicknesses (Fig.8).Some people prefer to choose colored solar collectors for placement in buildings,despite the fact that the black ones have higher absorption,and this is compatible with the architectural design from the esthetic perspective
Fig.6 HRTEM images and corresponding SAED patterns of as-deposited NbTiAlSiNX films with different nitrogen flow rates:a 0 ml·min-1,b 4 ml·min-1 and c 8 ml·min-1
Fig.7 Load-displacement curve a and hardness and modulus b of as-deposited NbTiAlSiNX films
The bi-absorbing layer of HMVF/LMVF was deposited on stainless-steel substrates,in order to characterize the optical properties (nitrogen flow rates of 4 and 8 ml·min-1,denoted by HMVF and LMVF,respectively).The absorptions of the absorbing layers under the corresponding thicknesses are listed in Table 3.The optimized thicknesses of HMVF and LMVF layers are 260 and 175 nm,respectively.It is clear that the absorption has no change compared to that of the as-deposited samples (Table 3),mainly because the films of HMVF and LMVF have no change in the phase structure and still remain in amorphous conditions,as can be seen in Fig.3.Interestingly,the absorption of the samples increases after annealing at1000℃for 1 h.Figure 10 shows XRD patterns of NbTiAlSiNX films after heat treatment at 1000℃.There is a change from amorphous to crystal structure.The metallic film shows an intermetallic structure with Nb5Si3,TiSi and Al3Ti,which are due to the extremely negative mixing enthalpy between Al and Si,Ti and Si,and Al and Ti,respectively.Moreover,the nitride films form fcc solid solution structure,but when nitrogen flow rate increases to8 ml·min-1,the film has simple fcc solid solution structure and a small amount of an unknown phase with nano-sized particles.Particles differing in size have formed during the course of crystallization and have produced an appropriate surface roughness that can increase the light absorption
Fig.8 Variation of absorption of thin film with deposition time.Thickness increasing gradually from a to f and each thickness presenting different colors
Fig.9 Absorption of mono-layer with various thicknesses
Table 3 Absorption of films before and after heat treatment.HMVF,LMVF and HMVF/LMVF deposited on stainless-steel (SS) substrates
Fig.10 XRD patterns of NbTiAlSiNX thin films after annealing at1000℃for 1 h
4 Conclusion
In this study,a series of NbTiAlSiNX high-entropy films were prepared using magnetron sputtering method in a mixture atmosphere of nitrogen and argon.All of the asdeposited films exhibit an amorphous structure which remains stable even at the high temperature of 700℃for24 h.The addition of nitrogen does not provide a significant enhancement on the hardness and modulus of the films.On the contrary,a greater amount of nitrogen would have a negative effect on the enhancement of the hardness and modulus.Moreover,the film exhibits a potential candidate as solar selective absorbing coatings for the photothermal conversion in the concentrated solar power.The colored films may cater to our pursuit of esthetics,especially in the building integration with solar collectors.The optimization of the multi-layer films,including the infrared-reflective layer,bi-absorbing layer and anti-reflective layer,still requires extensive experiments,and the thermal emissivity of the films deposited on stainless-steel substrates shall be further investigated.
Acknowledgements This study was financially supported by the National Natural Science Foundation of China (No.51471025).
参考文献
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