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J. Cent. South Univ. (2018) 25: 1295-1305 DOI: https://doi.org/10.1007/s11771-018-3826-4 Hydration film measurement on mica and coal surfaces using atomic force microscopy and interfacial... hydrophobic coal and hydrophilic mica surfaces were measured directly by atomic force microscopy (AFM) based on the bending mode of the nominal constant compliance regime in AFM force curve......
Microstructure Morphologies of Asphalt Binders using Atomic Force Microscopy李波1,2,YANG Jinyu2,CHEN Zhanquan1,LI Hailian1,21. Key Laboratory of Road & Bridge and Underground Engineering of Gansu...="ChDivSummary">We investigated microstructure morphologies of three asphalts(SK, Karamay, and Esso) used in China using atomic force microscopy(AFM). The topography and phase contrast images were obtained......
and mica. Key words: adsorption; cationic surfactants; interaction force; atomic force microscopy 1 Introduction To understand the properties of adsorbed surfactant films on solid surfaces, many research... and silica probe using AFM. The results were combined to discuss and further simulate the adsorption pattern of DTAC/CTAC on mica. The atomic force microscopy measurements which can provide......
conditioning for high-speed atomic force and friction force microscopy [J]. Microelectro Eng, 2003, 67/68: 938-944. [3] GEORG S, PHILIOPP J T, PAUL K H. Design and input-shaping control of a novel scanner for high-speed atomic force microscopy[J]. Mechatronics, 2008, 18: 282-288. [4] GEORG E, GEORG S, JOHANNES H, TZVETAN I, KATARINA I, ROH P, NIELS H, JONATHAN A, PHILIPP T, IVO W, PAUL K. Components......
Aggregation of Gold Nanoparticles and DNA Damage by Atomic Force Microscopy胡善洲1,刘鹏11. Department of Chemistry, School of Science, Wuhan University of Technology摘 要:The plasmid DNA binding and cleavage activities with gold nanoparticles(Au-NPs) were investigated by the integrated tools of UV-vis spectroscopy, atomic force microscopy(AFM), and DNA......
Histogram method for reliable thickness measurements of graphene films using atomic force microscopy(AFM)Yaxuan Yao,Lingling Ren,Sitian Gao,Shi LiDivision of Nano-Metrology and Materials Measurement, National Institute of Metrology摘 要:Atomic force microscopy(AFM) is a commonly used technique for graphene thickness measurement.However, due to surface......
) facet by atomic force microscopy (AFM). High-resolution X-ray diffraction (HRXRD) results indicate that CNGS crystals have good quality and free low-angle boundaries. The crystals also exhibit good optical quality and high optical transmittance in c-direction. Key words:czochralski method; gallium compounds; atomic force microscopy; [全文内容正在添加中] ......
at different frequencies in a quasi-static loading condition. References [1] CROFT D, SHED G, DEVASIA S. Creep, hysteresis, and vibration compensation for piezoactuators: Atomic force microscopy... of a piezoelectric stack actuator [J]. IEEE Transactions on Control System Technology, 2005, 13: 517-526. [5] SCHITTER G, STEMMER A. Model-based signal conditioning for high-speed atomic force and friction force......
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appropriate conditions.Key words:banded hematite jasper ore; selective coating; oleate colloidal magnetite; magnetic separation; atomic force microscopy......