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Trans. Nonferrous Met. Soc. China 22(2012) s579-s584 HR-TEM and FIB-SEM characterization of formation of eutectic-like structure from amorphous GdAlO3-Al2O3 system Y. H. HAN1, Y. HARADA1, J. F... skin-like microstructure was investigated using focused ion-beam scanning electron microscopy (FIB-SEM) and high-resolution transmission electron microscopy (HR-TEM). The amorphous films were heat......
2013 Abstract: The electromigration induced microstructure evolution and damage in asymmetric Cu/Sn-58Bi/Cu solder interconnects were investigated by in-situ SEM observation, focused ion beam (FIB... of microcracks, in the asymmetric solder interconnects is much severer than that in the symmetrical ones. FIB-SEM microanalysis reveals that the microregional heterogeneity in electrical resistance along......
Q235钢在武汉土壤模拟溶液中腐蚀行为的研究徐立,周学杰,郑鹏华,吴建平,吴军武汉材料保护研究所有限公司摘 要:Q235钢作为常用埋地管道材料,在武汉地区广泛使用,但其在以武汉地区为代表的弱碱性土壤环境中的腐蚀行为尚无深入研究.武汉地区土壤性质为弱碱性,含水率高,离子浓度相对较低.为此,采用阳极极化,超景深显微镜,聚焦离子束扫描电镜(FIB-SEM),EDS能谱,失重法等方法研究了Q235钢在武汉土壤模拟溶液中的腐蚀行为.结果表明:Q235钢在模拟溶液中的腐蚀行为与武汉土壤中广泛含有的HCO3-,CO32-,SO24-,Cl-浓度有关.HCO3-,CO32-浓度的增加会导致Q235钢出现钝化现象,且钝化现象随其浓度上升而加强,临界浓度分别为4.00×10-3mol/L和5.00×10-3mol/L.在......
贵州织金低磷层磷矿稀土赋存状态与磷矿浮选工艺研究刘意,陈婷,郑松,陈文祥,严春杰,王洪权,周森,张生,MUDENDA Chipenzi,陆红军,杨祥中国地质大学(武汉)材料与化学学院贵州省地质矿产中心实验室摘 要:对贵州省织金地区低磷层磷块岩型稀土矿石进行XRF,ICP,SEM/EDS,FIB-SEM分析.矿石中P2O5含量为9.97%,稀土总量为899.52μg/g,稀土以钇和镧,铈,钕为主.稀土元素赋存状态研究表明,稀土元素以类质同象形式赋存在胶磷矿中.采用浮选机反浮选方法进行选矿工艺研究.实验筛选出NECP6号为捕收剂,对捕收剂种类,用量,磨矿时间,硫酸用量和磷酸用量等浮选工艺条件进行了实验研究,结果表明:当NECP6号捕收剂用量为2.8 kg/t,磨矿时间25 min,硫酸用量为6.5 kg......
注入钨的实验,采用微分干涉差显微镜(DIC),场发射扫描电子显微镜(SEM)结合聚焦离子束(FIB)以及X射线光电子能谱仪,分别研究氮和氘等离子体辐照前后钨表面成分,形貌和微观组织结构的变化,采用超高真空热脱附系统对氮等离子体预先辐照后钨中氘的捕获状态和滞留总量进行分析.结果表明:经氮辐照后,钨样品表面形成了氮化钨相,进一步注入氘等离子体后其表面起泡增多,氘在钨中的滞留总量升高.这是由于氮化钨相的...(Scanningelectronmicroscopy, SEM)(双束FIB-SEM Tescan LYRA 3X MU)分析等离子体辐照W样品的表面和断面形貌.FIB-SEM分析时,首先使用SEM进行观察,调节电镜工作距离,通过SEM成像.然后,选定适当的切面位置,旋转样品台使离子束与样品所固定平面垂直,使用30 keV的Ga+束对样品选取位置进行切割,后通过SEM对倾斜55°的样品进行观察.使用X射......
图像序列,再现矿堆三维结构的基础;三维图像处理是结构表征的第二步,其目的是提取矿堆图像有效信息,是计算结构参数的前提. 当前较成熟的多孔介质无扰动成像技术包括计算机断层扫描(CT)技术,聚焦离子束-扫描电镜(FIB-SEM),核磁成像(MRI)和粒子成像测速(PIV)等.其中CT技术在矿堆结构成像上应用最普遍,高精度工业微CT (μCT)和粒子同步X射线CT (Synchrotron X-ray CT)的扫描精度可达微米级.FIB-SEM具有比CT更高的分别率,可达纳米级,但显然其样本观察区域也很小[31];在地球科学领域常用于化学成分和结构分析[32-33],在矿堆结构表征方面较少见.相对CT和FIB-SEM,MRI和PIV技术并不属于矿堆结构成像技术的范畴,这两个技术常被用于分析多孔介质中的溶液流动过程.但MRI技术易受铁元素干扰,因而不适用于含铁量高的矿石(大部分金属矿石),而PIV......
]Longford R M, Clinton C. In situ lift-out using FIB-SEM system[J]. Micron, 2004, 35: 607-611. [14]Neugebauer C A, Webb M B. Electrical conduction mechanism in ultrathin evaporated metal films[J]. Journal... TEM 试样通过SEIKO FIB-SMI2200聚焦离子束系统(FIB)来制备(图1), 其具体步骤见文献[13]. 制备出的试样尺寸为10μm ×5μm×160nm. 采用AES分析时, 一次电子束电压3keV, 电流1μA, Ar+离子刻蚀电流密度100μA/cm2, 电压3kV, 刻蚀剥离速度约为12nm/min. 图1 聚焦离子束系统制备的Cr-Si-Ni薄膜纵断面......
was observed by scanning electron microscopy (TESCAN VEGAⅡLMU) and Carl Zeiss Auriga dual column focused ion beam-scanning electron microscopy (FIB-SEM). Table 1 Chemical composition of ilmenite (mass... (SEM) and particle size analysis. It was shown that the graphite crystalline structure was easily destroyed along the (002) crystal plane during milling process. The particle size of ilmenite/graphite......
prepared by FIB lift-out using an FEI Scios dual beam FIB-SEM, with a viewing area size of approximately 6 μm × 6 μm and a nominal thickness of 0.15 μm. Samples were attached... its formability on a larger more industrially relevant scale as a comparison to alloys currently used commercially. SEM and TEM analysis was employed to observe microstructures pre and post forming......
investigated by FT-IR instrument (Nicolet iS10) using the KBr pellet. The morphologies of the synthesized SnO2, HA, and the SnO2 electrodes were characterized by ZEISS Auriga FIB-SEM, TEM (FEI TalosF 200S...]. Fig. 1 FT-IR spectrum of HA Fig. 2 SEM (a) and TEM (b) images of HA The surface morphology of HA was observed by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) (Fig......