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, and the microscopic morphologies of the samples were observed using Quanta250 FEG scanning electron microscope (SEM). The micro area composition was measured by energy dispersive spectrometer (EDS) attached......
and MWCNTs/LDHs composites were taken on the scanning electron microscope (SEM) (JEOL, Japan). Energy dispersive X-ray (EDX) analysis was aimed to identify the actual elemental incorporation contents......
scanning electron microscope (SEM). The phase identification was performed by a Rigaku D/max 2500 X-ray diffractometer. The solute distribution profile was detected by an Oxford INCA Energy 300 energy......
were examined by a scanning electron microscope (SEM, Vega Tescan) equipped with an energy dispersive spectrometer (EDS, Oxford INCA PentaFET×3). The phase composition of this alloy was analyzed......
and cross-sectional microstructures of powder were examined with a scanning electron microscope (SEM, Philips S-4800, Hitachi Ltd., Yoshida-Cho, Totsuka-Ku, Yokohama, Japan), which was equipped with an Oxford......
制在50~100 mA,采用液氮冷却至-25 ℃左右. 2 结果与分析 2.1 合金初始态的组织特征 图1 合金的BSE形貌照片 Fig. 1 BSE images of alloy 图1(a)显示了原始铸态合金的背散射电子(Back scattered electron,BSE)形貌照片.在铸态合金中,晶界上连续分布着大量的α(Al......
. L10-TiA l金属间化合物Mn, Nb合金化电子结构的计算[J]. 航空材料学报, 2005, 25(5): 15-19. CHEN Lü, PENG Ping, LI Gui-fa, HU Yan-jun, ZHOU Dian-wu, ZHANG Wei-min. First-principles study on electron ic structure of L10-TiAl......
film solar cells[J]. IEEE transactions on electron devices, 1999, 46: 2048-2054. [9] HABUKA H, KATAYAMA M. Nonlinear increase in silicon epitaxial growth rate in a SiHCl3-H2 system under atmospheric......
analyzed by electron backscatter diffraction[J]. Materials and Design, 2015, 65: 534-542. [20] LOU X Y, LI M, BOER R K, AGNEW S R, WAGONER R H. Hardening evolution of AZ31B Mg sheet[J]. International......
Mg-Zn-Y-Zr alloys [J]. Materials Science and Engineering A, 2004, 373: 320-327. [8] PIERCE F S, POON S J, GUO Q. Electron localization in metallic quasicrystals [J]. Science, 1993, 261: 737-739. [9......