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, LI Zhu. Analysis of transformer winding loss for high-frequency switching power supply based on FEM[J]. Chinese Journal of Electron Devices, 2012, 35(5): 558-561. [4] 张国权, 徐月朗. 开关电源中线圈的邻近效应研究[J]. 中国......
): 554-563. [6] PRIMA F, VERMAUT P, TEXIER G, Ansel D, GLORIANT T. Evidence of α-nanophase heterogeneous nucleation from ω particles in a β-metastable Ti-based alloy by high- resolution electron......
;mL H2O) for 15 s. Microstructural observation was carried out using an OLYMPUS BX60M metallographic microscope and a scanning electron microscope (SEM) equipped with EDS. The X-ray diffraction......
, the microstructure of CVTP was detected using scanning electron microscope (SEM, Ultra Plus; Carl Zeiss GmbH, Jena, Germany) equipped with the backscattering detector (BSE) and energy disperse spectroscope (EDS......
of the grouting materials was examined using a HELIOS Nano Lab 600i field-emission scanning electron microscope (FEI Ltd, Hillsboro, USA) operating at 25 kV. 3 Results of CCGM performance 3.1 Gel time The gel time......
. Experimental observation of the quantum Hall effect and berry's phase in graphene[J]. Nature, 2005, 438: 201-204. [6] BOLOTIN K I, SIKES K J, JIANG Z, et al. Ultrahigh electron mobility in suspended......
. Fractal dimension of RGB color images [J]. Optik-International Journal for Light and Electron Optics, 2018, 162: 196-205. DOI: 10.1016/j.ijleo.2018.02.066. [29] FOUDA J S A E, KOEPF W. Efficient detection......
as a healing mechanism of dilatation and work hardening [20]. HIRTH and TULLIS [21] determined three regimes of dislocation creep by using optical and transmission electron microscopy... nucleus. The pore throat in the specimen will be filled by the recrystallization, which leads to poor pore connectivity and lower permeability. A scanning-electron microscope assessment of the repaired......
samples were measured by the Archimedes principle. The microstructures and morphologies of the sintered samples were analyzed by environmental scanning electron microscopy (SEM, Quanta 200, FEI, Holland......
on a Panalytical X′Pert PRO equipped with Cu Kα radiation (λ=0.15406 nm) at 40 kV and 40 mA. Microstructure observation was carried out by a scanning electron microscope (SEM, FEI Nova Nano SEM 450). 3......