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J. Cent. South Univ. (2020) 27: 711-720 DOI: https://doi.org/10.1007/s11771-020-4325-y Influence of cobalt content on microstructure and corrosion performance of extruded Sn-9Zn solder alloys JIANG... to the environmental concerns. The present work focuses on the effect of cobalt content (0, 0.5 and 3.0) on the microstructural characteristics, melting point and corrosion performance of extruded Sn-9Zn solder alloys......
Science and Engineering, Chongqing University, Chongqing 400044, China) Abstract: The sinusoidal vibration failure behavior of ball grid array(BGA) solder joints reflowed with different temperature...(Plastic ball grid array package,PBGA)元件边缘处的焊球上.YANG等[3]用循环扫描的方式表征了PBGA的动态性能,同样发现疲劳失效总是发生在PBGA元件中边缘处的焊球上.MAIO等[13-14]研究了不同振动频率下的振动可靠性,研究表明断口位置非常靠近IMC和焊点的界面处.YONG等[15]研究了多种无铅钎料在振动和不同温度环境下的可靠性,研究表明在所有的钎料中......
界面耦合作用对Cu(Ni)/Sn-Ag-Cu/Cu(Ni)BGA焊点界面IMC形成与演化的影响李勋平1,周敏波1,夏建民1,马骁1,张新平1(1.广东省广州市华南理工大学材料科学与工程学院)摘 要:研究了焊盘材料界面耦合作用对Cu(Ni)/Sn-3.0Ag-0.5Cu/Cu(Ni)BGA(Ball Grid Array)结构焊点焊后态和125℃等温时效过程中界面金属间化合物(IMC)的成分,形貌和生长动力学的影响.结果表明.凸点下金属层(UBM)Ni界面IMC的成分与钎料中Cu含量有关,钎料中Cu含量较高时界面IMC为(Cu.Ni)6Sn5.而Cu含量较低时,则生成(Cu,Ni)3Sn4;Cu-Ni耦合易导致Cu/Sn-3.0Ag 0.5Cu/Ni焊点中钎料/Ni界面IMC异常生长并产生剥离而进入钎料......
): 123513. [13] KSUALKE P, SCHMIDT W, TITERLE L, BOHNAKER H, OPPERT T, ZAKEL E. Solder ball bumper SB2-A flexible manufacturing tool for 3-dimensional sensor and microsystem packages [C]// Proceedings...Trans. Nonferrous Met. Soc. China 24(2014) 1619-1628 Electromigration induced microstructure evolution and damage in asymmetric Cu/Sn-58Bi/Cu solder interconnect under current stressing Wu YUE, Hong......
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, GUO Jing-kun, YANG Xie-long. Preparation of nanocrystalline Zn ferrite by high energy ball milling [J]. Chinese Journal of Materials Research, 1999, 13(2): 142-146. (in Chinese) [19] TANAKA H......
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Robowler: Design and development of a cricket bowling machine ensuring ball seam positionRAZA Ali1, Diegel Olaf 2, Arif Khalid Mahmood2(1. Mechatronics and Control Engineering, University... owing to the run-up and ball release time energy requirement to achieve speed and variations. Therefore, human bowlers cannot bowl for extended periods and numerous mechanical bowling machines have......
a mixture of the bulk solder and the solder/IMC layer interface, i.e., failure mode 6 occurred. The length of this crack exceeded 2/3 of the solder ball diameter. Similar to solder joints No. 3 of other chips... A, 2007, 460-461: 595-603. [10] LAI Y S, SONG J M, CHANG H C, CHIU Y T. Ball impact responses of Ni- or Ge-doped Sn-Ag-Cu solder joints [J]. Journal of Electronic Materials, 2008, 37(2): 201-209. [11] SON......