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Shi-chun. Performance of non-evaporable getter to maintain vacuum of Dewar module of infrared focal plane detector and its application[J]. Infrared and Laser Engineering, 2018,47(10): 119-127. [9] 继 国......
, they leave small dislocation loops around them [39]. These dislocation cycles apply back stress that must be overcome in order for dislocations moving in the sliding plane to continue their movement......
to the Ni (111) plane. The Mg (100), (002), (101), and (103) diffraction peaks in the XRD profiles were attributable to the substrate of Mg alloys. This was probably because X-ray penetrated the thin......
by controlling the movement of the top die. Because two same complex pieces were formed together during the production experiment, the nodes in the symmetrical plane were restrained in Ux direction......
reinforcements were adsorbed on the plane, which could provide more nucleation sites. In this study, Ag-GNSs particles were embedded on the surface of the solder particles via ball milling, establishing a reliable......
tip. This region is referred to as the plastic zone. The size of the plastic zone depends on applied stress intensity and yield strength of the material. Under plane strain conditions, the size......
of center plane across scanning direction (a), simulation of single-pass grain structure of center plane across scanning direction (b), simulation of single-pass grain structure of cross-section along......
on the clean, vacancy defective Mg (0001) surfaces and iron alloying magnesium hydride were calculated by using a first-principles plane-wave pseudopotential method, the mechanism of improved properties...(110)面的电子密度分布 Fig.9 Charge distributions on (110) plane of Mg10H20(a), (Mg9Fe)H20(b) and (Mg8Fe2)H20(c) 3 结论 1) H2在清洁Mg(0001)表面呈现较微弱的物理吸附,电荷由Mg表面向H2产生了少量转移,Mg(0001)表面存在空位缺陷,对H2的物理吸附能力增强......
plane in low concentration solutions are similar to one another due to the low anisotropy in KOH etchant. PENG et al[65] studied the role of solvent or H2O in etching and its role in etching. LIU et al......
. 图28 试样在850 ℃和307 MPa应力下于75%NaCl+ 25%Na2SO4环境中断裂时间5 h后晶界裂纹及其S的EDX面扫描分布[27] Fig.28 Intergranular cracks (a) and EDX plane scanning distribution of S (b) for specimen crept at 850......