Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation
来源期刊：JOURNAL OF MATERIALS SCIENCE TECHNOLOG2018年第7期
论文作者：Y.K.Zhu Q.Wang J.P.Hou Z.J.Zhang G.P.Zhang Z.F.Zhang
文章页码：1214 - 1221
摘 要：The evolution of microstructure in the drawing process of commercially pure aluminum wire(CPAW)does not only depend on the nature of materials, but also on the stress profile. In this study, the effect of stress profile on the texture evolution of the CPAW was systematically investigated by combining the numerical simulation and the microstructure observation. The results show that the tensile stress at the wire center promotes the formation of <111> texture, whereas the shear stress nearby the rim makes little contribution to the texture formation. Therefore, the <111> texture at the wire center is stronger than that in the surface layer, which also results in a higher microhardness at the center of the CPAW under axial loading.
Y.K.Zhu1，Q.Wang1，J.P.Hou1，Z.J.Zhang1，G.P.Zhang1，Z.F.Zhang1
1. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences
摘 要：The evolution of microstructure in the drawing process of commercially pure aluminum wire(CPAW)does not only depend on the nature of materials, but also on the stress profile. In this study, the effect of stress profile on the texture evolution of the CPAW was systematically investigated by combining the numerical simulation and the microstructure observation. The results show that the tensile stress at the wire center promotes the formation of <111> texture, whereas the shear stress nearby the rim makes little contribution to the texture formation. Therefore, the <111> texture at the wire center is stronger than that in the surface layer, which also results in a higher microhardness at the center of the CPAW under axial loading.
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