简介概要

MEVVA磁过滤等离子技术制备的Fe纳米颗粒薄膜结构

图书来源:二元合金相图及中间相晶体结构 二元合金相图及中间相晶体结构

作 者:唐仁政 田荣璋

出版时间:2009-05

定 价:320元

图书ISBN:978-7-81105-831-4

出版单位:中南大学出版社

详情信息展示

Effect of hydration film on scanning images of atomic force microscope

Changsheng Peng1,4), Qingbao Gu2), Hong Meng3), and Shaoxian Song4) 1) The Key Lab of Marine Environmental Science and Ecology, Ministry of Education, Ocean University of China, Qingdao 266003, China 2) Chinese Research Academy of Environmental Sciences, Beijing 100012, China 3) School of Chemical Engineering, Beijing University of Chemical Technology, Beijing 100029, China 4) Institute de Metalurgia, Universidad Autonoma de San Luis Potosi, Av. Sierra Leona 550, San Luis Potosi, C. P. 78210, Mexico

摘 要:<正>A standard calibration grating was used for image scanning to investigate the effect of hydration films on imaging resolution by Atomic Force Microscope (AFM). The results showed that the hydration films greatly affect the imaging resolution for the tapping mode, but no evident effect on the contact mode. The possible reasons for the effect of hydration films on scanning images of AFM are also brought forward here.

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