简介概要

MEVVA磁过滤等离子技术制备的Fe纳米颗粒薄膜结构

图书来源:二元合金相图及中间相晶体结构 二元合金相图及中间相晶体结构

作 者:唐仁政 田荣璋

出版时间:2009-05

定 价:320元

图书ISBN:978-7-81105-831-4

出版单位:中南大学出版社

详情信息展示

Measurement of the remnant magnetic-field in Lorentz mode using permalloy

Haihua LIU 1),Xiaokun DUAN 2),Renchao CHE 1),Zhifeng WANG 1) and Xiaofeng DUAN 1) 1) Beijing Laboratory of Electron Microscopy,Beijing National Laboratory for Condensed Matter Physics,Institute of Physics,Chinese Academy of Sciences,Beijing 100190,China 2) Advanced Technology & Materials Co.,Ltd.,Beijing 100081,China

摘 要:A novel method was reported to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 transmission electron microscope equipped with a Lorentz lens.The movement of the circle Bloch line of the cross-tie wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and adjusting the objective lens current.The remnant magnetic field is estimated to be about 17 Oe,in a direction opposite to that of the objective lens magnetic field.The remnant magnetic field can be compensated by adjusting the value of the objective lens current.

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