TEM精确测定无理择优界面取向

来源期刊：金属学报2010年第4期

论文作者：孟杨 谷林 张文征

文章页码：411 - 417

关键词：界面取向； 界面迹线； 菊池花样； 直立取向

Key words：interface orientation； interface trace； Kikuchi pattern； edge-on orientation

摘    要：本文介绍了一种应用透射电镜(TEM)的电子衍射菊池花样来精确测量无理择优界面取向的方法.根据误差分析的结果,该方法从提高测量精度和增大界面矢量间夹角两方面出发,分别测量界面迹线和直立(edge-on)取向,计算无理择优界面的取向.相对其它方法,该方法将测量误差的影响降到最小,其计算结果分布集中,收敛性最好.

Abstract: This paper presents a method for precise determination of the orientation of the irrational preferred interface by using TEM.The interface trace and the edge-on orientations are measured carefully and separately to minimize systematic error of the results.This method was developed according to the error analysis and the fact that the accuracy of the measurement is higher when the measurement is made directly on an interface trace than on its project on an edge-on orientation,and when the angle between the trace and the beam direction along the an edge-on orientation is larger. Compared with existing methods,the present method has minimized the measurement errors and its results show a better convergence.