Deformation Strength of Nanocrystalline Thin Films
来源期刊：JOURNAL OF MATERIALS SCIENCE TECHNOLOG2017年第7期
论文作者：W.Blum P.Eisenlohr
文章页码：718 - 722
摘 要：The data of deformation strength and microstructure of thin films of nanocrystalline Pd recently provided by Colla et al. have been analysed. It is shown that the properties of the films with cylindrical grains of30 nm diameter extending over a significant portion of the film thickness(≈90 nm) are quantitatively comparable to what is known from nanocrystalline bulk material. This is explained in terms of boundarymediated processes governing emission, storage, and recovery of dislocations.
W.Blum1，P.Eisenlohr2
1. Department of Materials Science, Inst.I, University of Erlangen-Nürnberg2. Department of Chemical Engineering and Materials Science, Michigan State University
摘 要：The data of deformation strength and microstructure of thin films of nanocrystalline Pd recently provided by Colla et al. have been analysed. It is shown that the properties of the films with cylindrical grains of30 nm diameter extending over a significant portion of the film thickness(≈90 nm) are quantitatively comparable to what is known from nanocrystalline bulk material. This is explained in terms of boundarymediated processes governing emission, storage, and recovery of dislocations.
关键词：
